Photo by IEEE

Dr. Chulsoon Hwang, professor of electrical and computer engineering at Missouri S&T, and Hanyu Zhang, a Ph.D. student in electrical and computer engineering, played key roles in an award-winning paper at the 2025 IEEE International Symposium on Signal and Power Integrity (SIPI).

The paper, “Impact of Voltage Regulator Modules on Power Distribution Network Impedance,” received two recognitions at the symposium:

  • 🏆 Best SIPI Symposium Paper Award
  • 🎓 Best SIPI Symposium Student Paper Award – Honorable Mention

“This recognition underscores the strength of Missouri S&T’s contributions to the global power integrity community,” Hwang says. “It also highlights the dedication and talent of our students, who are helping to solve some of the most complex challenges in power distribution for next-generation electronic systems.”

The paper was co-authored with Zhiping Yang, CEO of Ansys, Alvis Hsu, and Lung-Yu (Ryan) Hou. The team’s work provides new insights into how voltage regulator modules affect power distribution network impedance, an issue critical to the design of high-performance computing and communication systems.